( An Autonomous Institution of University Grants Commission, New Delhi )
University Campus, Khandwa Road, Indore, M.P., India
LTHM Scanning Probe Microscope
Facilities & expertise
Key word: Magnetic imaging, microscopy, MFM, SPM
Scanning Probe microscopy measures surface property by scanning a cantilever across the sample surface. Cantilevers coated with magnetic material can provide can provide magnetic profile of the surface by measuring the force gradient perpendicular to sample surface. The technique is suitable for imaging magnetic domains, magnetic phase separation, vortices in superconductor etc. on a length scale of ~10 - 100 nm length scale. By using cantilever with conductive tip, piezo response force and conductivity can be mapped on nano-meter length scale. The capability to vary temperature down to 5 K and magnetic field up to 9 Tesla provides an opportunity to study these properties in temperature and magnetic field space.