UGC-DAE Consortium for Scientific Research
( An Autonomous Institution of University Grants Commission, New Delhi )
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Scanning Electron Microscopy Laboratory
Dr. D.M.Phase
UGC-DAE-CSR
Specifications:
  • FModel : JEOL JSM 5600
  • Resolution : 3.5 nm
  • Images : secondary electron image, backscattered electron images (composition, topography, shadow)
  • Magnification : x18 to 300,000 (in 136 steps)
  • Accelerating Voltage : 0.5 to 30 kV (53 steps)
  • Speciman stage : Large size eucentric goniometer
  • Displayed image : 640 x 480 pixel
  • Image memory : 1280 x 960 pixels
  • Evacuation system : one DP with one RP
  • Optional Attachment : Energy Dispersive X-ray spectrometer (EDS)

EDS Model : INCA Oxford:
  • Qualitative and quantitative analysis (Analyser)
  • Easy Phase Discrimination (Mapping)

Group Members:
  • Mr. Vinay Ahire, Junior Engineer
Scanning Electron Microscope
Energy dispersive spectrometer