UGC-DAE Consortium for Scientific Research
( An Autonomous Institution of University Grants Commission, New Delhi )
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High resolution x-ray diffraction system
Dr. V.Raghavendra Reddy
UGC-DAE-CSR, Indore
Relevant publications

  • Swift heavy ion induced modification in Ti/Si system studied with sub-nanometer resolution "., Parasmani Rajput, Ajay Gupta, V.R.Reddy, Vasant .Sathe and D.K.Avasthi.,  J.Phys: Cond. Mater., 19, 36221  (2007)

  • "Study of interface structure in magnetic multilayers using x-ray standing waves"., Ajay Gupta , Dileep Kumar,  Carlo  Meneghini ., Phys. Rev. B 75, 064424 (2007)

  • "Phase transitions in Co thin film induced by low energy and high energy ion beam irradiation"., Ratnesh Gupta,  A.Khandelwal, D.K.Avasthi, K.G.M.Nair and Ajay Gupta., J. Appl. Phys., 107, 033902 (2010)

  • V.Raghavendra Reddy, S.Kavita and Ajay Gupta., "57Fe Mossbauer study of L10 ordering in 57Fe/Pt multilayers"., J. Appl. Phys., 99 (2006) 113906

  • V.Raghavendra Reddy, S.Kavita, S.Amrithpandian, Ajay Gupta and B.K.Panigrahi., "Study of low energy Ar+ ion irradiated 57Fe/Pt multilayers"., J. Phys.: Cond.. Matter 18 (2006) 6401-6407


-scans of GaFeO3 films on YSZ(001) substrate confirming the epitaxial nature
Reciprocal space mapping of epitaxial BiFeO3 thin films
In-plane grazing incidence x-ray diffraction patterns of Au (60nm) thin film
Depth profiling of marker layers using X-ray standing wave experiments
X-ray reflectivity patterns of Fe/Pt multilayers with thermal annealing.  Intensity variation of first Bragg peak  gives the information about interdiffusion
System Specifications
  • q-qgoniometer with 0.0001 deg step size
  • 3kW X-ray generator with Cu and Mo targets
  • Incident beam optics: Gobel mirror and double crystal monochormator for Cu and Gobel mirror for Mo radiations
  • LiFmonochromator in the diffracted beam arm
  • Possibility of doing high resolution X-ray diffraction measurements (width of Si(111) peak ~26 arc.sec at 22.4 deg)
  • Possibility of mapping the reciprocal space
  • Possibility of doing in-plane X-ray diffraction measurements
  • Possibility of doing x-ray standing wave measurements